Abbreviation: Scan Electron Microsc

ISSN: 0586-5581 (Print) 0586-5581 (Linking)

Impact Factor

No impact factor infomation for this journal.
Other titles:
SEM
Continued by:
Scanning microscopy
Start year:
1968
End year:
1986
Frequency:
Quarterly, 1980-1986
Country:
United States
Language:
English
Topics:
Microscopy, Electron, Scanning
Publisher:
Chicago Il : Scanning Electron Microscopy
Publication type:
Congresses